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Home > Technology > Technology General & Other > Characterization of High Tc Materials and Devices by Electron Microscopy-eBook

Characterization of High Tc Materials and Devices by Electron Microscopy

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This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

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Title of ebook: Characterization of High Tc Materials and Devices by Electron Microscopy
ISBN: 9780511038150
Publisher: Cambridge University Press
Internet download file size: 203054 kb
Pages: 406
Released online for download: 07-05-1996
Editor: Browning, Nigel D.
Editor: Pennycook, Stephen J.